R. Heiderhoff: search on Z-Library

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1

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Commercial Agency Contracts and Freedom of Contract

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 516 KB

english, 2012

2

Private Autonomy in Germany and Poland and in the Common European Sales Law () || CESL – A Chance for True Freedom of Contract for the Consumer

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 403 KB

english, 2012

3

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Party Autonomy and the New Polish Act on Private International Law

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 400 KB

english, 2012

4

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Freedom of Contract and Freedom of Jurisdiction – Party Autonomy in Determining Contract Jurisdiction

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 386 KB

english, 2012

5

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Private Autonomy and the Public Law

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

File:

PDF, 348 KB

2012

6

MPCVD diamond deposition on bias pretreated porous silicon

Spitzl, R., Raiko, V., Heiderhoff, R., Gnaser, H., Engemann, J.

Journal:

Diamond and Related Materials

Year:

1995

Language:

english

File:

PDF, 721 KB

english, 1995

7

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Autonomy – A Legal Axiom

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 271 KB

english, 2012

8

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Unfair Contract Terms in Business to Business Transactions

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 495 KB

english, 2012

9

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Anti-Discrimination and Selection of Contractual Partners

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 339 KB

english, 2012

10

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Autonomy of the Will Versus Fair Use of Copyright Materials Modification by Example of the Geoportal Website

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 382 KB

english, 2012

11

Teilleistung im Kaufrecht

Bettina Heiderhoff and Frank Skamel

Journal:

JuristenZeitung

Year:

2006

Language:

german

File:

PDF, 1.97 MB

german, 2006

12

Correlation of scanning thermal microscopy and near-field cathodoluminescence analyses on a blue GaN light emitting device

R. Heiderhoff, M. Palaniappan, J.C.H. Phang, L.J. Balk

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 467 KB

english, 2000

13

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Backmatter

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

german

File:

PDF, 1.19 MB

german, 2012

14

Nanoscopic investigations of diamond properties by scanning probe microscopy techniques

Cramer, R.M., Heiderhoff, R., Balk, L.J.

Journal:

Diamond and Related Materials

Year:

1999

Language:

english

File:

PDF, 423 KB

english, 1999

15

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Frontmatter

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 233 KB

english, 2012

16

Near-field cathodoluminescence of nanoscopic diamond properties

Heiderhoff, R., Cramer, R.M., Sergeev, O.V., Balk, L.J.

Journal:

Diamond and Related Materials

Year:

2001

Language:

english

File:

PDF, 1.50 MB

english, 2001

17

Gemeinsame Sorge unverheirateter Eltern – wird endlich alles gut?

Heiderhoff, Bettina

Journal:

JuristenZeitung

Year:

2013

Language:

german

File:

PDF, 119 KB

german, 2013

18

[IEEE 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Enschede, The Netherlands (8-11 October 1996)] Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Nanoscopic evaluation of semiconductor properties by scanning probe microscopies

Balk, L.J., Heiderhoff, R., Koschinki, P., Maywald, M.

Year:

1996

Language:

english

File:

PDF, 1.14 MB

english, 1996

19

[IEEE 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - singapore (2008.07.7-2008.07.11)] 2008 15th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

Pugatschow, A., Heiderhoff, R., Balk, L.J.

Year:

2008

Language:

english

File:

PDF, 268 KB

english, 2008

20

[IEEE 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India (2007.07.11-2007.07.13)] 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - EBIC Investigations on Active Polymer Devices

Pugatschow, A., Heiderhoff, R., Forster, M., Scherf, U., Balk, L.J.

Year:

2007

Language:

english

File:

PDF, 3.62 MB

english, 2007

21

Morphometry of human terminal and vellus hair follicles

Annika Vogt, Sabrina Hadam, Marc Heiderhoff, Heike Audring, Juergen Lademann, Wolfram Sterry, Ulrike Blume-Peytavi

Journal:

Experimental Dermatology

Year:

2007

Language:

english

File:

PDF, 160 KB

english, 2007

22

Correlation of the electrical, thermal, and optical properties of CVD diamond films by scanning microscopy techniques

Heiderhoff, R., Koschinski, P., Maywald, M., Balk, L.J., Bachmann, P.K.

Journal:

Diamond and Related Materials

Year:

1995

Language:

english

File:

PDF, 900 KB

english, 1995

23

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Table of Contents

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 229 KB

english, 2012

24

Dynamic Near-Field Scanning Thermal Microscopy on thin films

Heiderhoff, R., Li, H., Riedl, T.

Journal:

Microelectronics Reliability

Year:

2013

Language:

english

File:

PDF, 850 KB

english, 2013

25

[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Determination of the local electric field strength near electric breakdown

Geinzer, T., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

Year:

2010

Language:

english

File:

PDF, 825 KB

english, 2010

26

Private Autonomy in Germany and Poland and in the Common European Sales Law () || Foreword

Drygala, Tim, Heiderhoff, Bettina, Staake, Marco, Zmij, Grzegorz

Year:

2012

Language:

english

File:

PDF, 244 KB

english, 2012

27

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations

A. Pugatschow, R. Heiderhoff, L.J. Balk

Journal:

Microelectronics Reliability

Year:

2007

Language:

english

File:

PDF, 383 KB

english, 2007

28

Europäisches und internationales Insolvenzrecht || Die Regelungen zur internationalen Zuständigkeit in Ehesachen in der Verordnung (EG) Nr. 2201/2003. Vergemeinschaftung, Anwendungsbereich und insbesondere die Anknüpfung an die Staatsangehörigkeit. (Studien zum ausländischen und internationalen Privatrecht. 116.)by Jörg Dilger

Review by: Bettina Heiderhoff

Journal:

Rabels Zeitschrift fuer auslaendisches und internationales Privatrecht

Year:

2006

Language:

german

File:

PDF, 535 KB

german, 2006

29

[IEEE 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Naples, Italy (04-08 June 2006)] 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Dynamic Behavior of High-Power Diodes Analyzed by EBIC

Pugatschow, A., Geinzer, T., Heiderhoff, R., Niedernostheide, F.-J., Schulze, H.-J., Wiedenhorst, B., Balk, L.J.

Year:

2006

Language:

english

File:

PDF, 3.61 MB

english, 2006

30

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - In situ nanomechanical measurement of Cu nanowires

Zhang, Y.F., Zhang, C.H., Han, X.D., Ji, Y., Ma, J., Zhang, Z., Heiderhoff, L. R.

Year:

2013

Language:

english

File:

PDF, 765 KB

english, 2013

31

Characterization of electronic materials and devices by scanning near-field microscopy

L.J. Balk, R. Heiderhoff, J.C.H. Phang, Ch. Thomas

Journal:

Applied Physics A: Materials Science & Processing

Year:

2007

Language:

english

File:

PDF, 450 KB

english, 2007

32

Prognosis of the individual course of disease - steps in developing a decision support tool for Multiple Sclerosis

M Daumer, A Neuhaus, C Lederer, M Scholz, JS Wolinsky, M Heiderhoff, the Sylvia Lawry Centre for Multiple Sclerosis Research

Journal:

BMC Medical Informatics and Decision Making

Year:

2007

Language:

english

File:

PDF, 787 KB

english, 2007

33

Acoustic near-field conditions in an ESEM/AFM hybrid system

Thomas, Ch, Heiderhoff, R, Balk, L J

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 698 KB

english, 2007

34

Use of a patient information leaflet to influence patient decisions regarding mode of administration of NSAID medications in case of acute low back pain

Thomas Rosemann, Stefanie Joos, Thorsten Koerner, Marc Heiderhoff, Gunter Laux, Joachim Szecsenyi

Journal:

European Spine Journal

Year:

2006

Language:

english

File:

PDF, 191 KB

english, 2006

35

Indium-Free Perovskite Solar Cells Enabled by Impermeable Tin-Oxide Electron Extraction Layers

Hu, Ting, Becker, Tim, Pourdavoud, Neda, Zhao, Jie, Brinkmann, Kai Oliver, Heiderhoff, Ralf, Gahlmann, Tobias, Huang, Zengqi, Olthof, Selina, Meerholz, Klaus, Többens, Daniel, Cheng, Baochang, Chen, Y

Journal:

Advanced Materials

Year:

2017

Language:

english

File:

PDF, 1.48 MB

english, 2017

36

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations

A.-K. Tiedemann, K. Kurz, M. Fakhri, R. Heiderhoff, J.C.H. Phang, L.J. Balk

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 839 KB

english, 2009

37

Left stellate ganglion block has only small effects on left ventricular function in awake dogs before and after induction of heart failure. (Institut für Klinische Anaesthesiologie, Heinrich-Heine-Universität, Düsseldorf, Germany) Anesth Analg 2000;91:787–792.

Jose Mullenheim, Benedikt Preckel, Detlef Obal, Marc Heiderhoff, Juliane Hoff, Volker Thämer, Wolfgang Schlack:

Journal:

Year:

2001

Language:

english

File:

PDF, 146 KB

english, 2001

38

200 femtometer sensitivity for near-field analysis of surface acoustic waves in a scanning electron / scanning probe microscope hybrid system

Thomas, Ch., Heiderhoff, R., Balk, L. J.

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 521 KB

english, 2007

39

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy

Tiedemann, A.-K., Fakhri, M., Heiderhoff, R., Phang, J.C.H., Balk, L.J.

Year:

2009

Language:

english

File:

PDF, 8.17 MB

english, 2009

40

[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced SEM/SPM microscopy

Heiderhoff, Ralf

Year:

2012

Language:

english

File:

PDF, 1.69 MB

english, 2012

41

[IEEE 2006 IEEE International Reliability Physics Symposium Proceedings - San Jose, CA, USA (2006.03.26-2006.03.30)] 2006 IEEE International Reliability Physics Symposium Proceedings - Time-Resolved and Stroboscopic EBIC Analyses on Dynamically Biased Active Devices

Pugatschow, A., Geinzer, T., Heiderhoff, R., Niedernostheide, F.-j., Balk, L.J.

Year:

2006

Language:

english

File:

PDF, 1.20 MB

english, 2006

42

Teilleistung im Kaufrecht

Heiderhoff, Bettina, Skamel, Frank

Journal:

JuristenZeitung

Year:

2006

Language:

german

File:

PDF, 135 KB

german, 2006

43

[IEEE 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, Jiangsu, China (2009.07.6-2009.07.10)] 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Thermal conductivity studies of a GaN-sapphire structure by combined scanning thermal microscopy and electron backscatter diffraction

Zhang, Y.F., Wang, L., Ji, Y., Han, X.D., Zhang, Z., Heiderhoff, R., Tiedemann, A.-K., Balk, L. J.

Year:

2009

Language:

english

File:

PDF, 4.19 MB

english, 2009

44

Highly Robust Indium-Free Transparent Conductive Electrodes Based on Composites of Silver Nanowires and Conductive Metal Oxides

Zilberberg, Kirill, Gasse, Felix, Pagui, Richie, Polywka, Andreas, Behrendt, Andreas, Trost, Sara, Heiderhoff, Ralf, Görrn, Patrick, Riedl, Thomas

Journal:

Advanced Functional Materials

Year:

2014

Language:

english

File:

PDF, 4.19 MB

english, 2014

45

[IEEE 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (8-12 July 2002)] Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614) - SEM/SThM-hybrid-system: a new tool for advanced thermal analysis of electronic devices

Altes, A., Joachimsthaler, I., Zimmermann, G., Heiderhoff, R., Balk, L.J.

Year:

2002

Language:

english

File:

PDF, 677 KB

english, 2002

46

SPIE Proceedings [SPIE OE/LASE '94 - Los Angeles, CA (Sunday 23 January 1994)] Diamond-Film Semiconductors - Characterization of MPCVD diamond films grown on porous silicon

Heiderhoff, R., Spitzl, R., Maywald, M., Raiko, V., Balk, Ludwig J., Engemann, J., Tamor, Mike A., Aslam, Mohammad

Year:

1994

Language:

english

File:

PDF, 1.12 MB

english, 1994

47

Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques

M. Fakhri, A.-K. Geinzer, R. Heiderhoff, L.J. Balk

Journal:

Microelectronics Reliability

Year:

2010

Language:

english

File:

PDF, 1.12 MB

english, 2010

48

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Nanoscale thermally induced strain and stress analysis by complementary Scanning Thermal Microscopy Techniques

Fakhri, M., Geinzer, A.-K., Heiderhoff, R., Balk, L.J.

Year:

2011

Language:

english

File:

PDF, 256 KB

english, 2011

49

A universal scanning-probe-microscope-based hybrid system

Joachimsthaler, I, Heiderhoff, R, Balk, L J

Journal:

Measurement Science and Technology

Year:

2003

Language:

english

File:

PDF, 880 KB

english, 2003

50

Near-field detection cathodoluminescence investigations

R. M. Cramer, V. Ebinghaus, R. Heiderhoff, L. J. Balk

Year:

1998

Language:

english

File:

PDF, 446 KB

english, 1998

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